Study of damage profile of GaAs substrate by irradiation with 100 KeV energy Silver ions: by simulation with SRIM/TRIM Software. Leadership, Education, Personality: An Interdisciplinary Journal, ISSN: 2524-6178, [S. l.], v. 19, n. 1, p. 1306–1312, 2025. DOI: 10.1366/42nnv755. Disponível em: https://sibe.rpress.co.in/index.php/jimr/article/view/814.. Acesso em: 21 feb. 2026.